{
    "basic_info": {
        "name": "张云鹏",
        "gender": "男",
        "phone": "13815329825",
        "email": "zhangyunpeng_ys@foxmail.com",
        "age": "24",
        "birth_date": "",
        "location": "江苏南京",
        "work_years": "0.4"
    },
    "education": [
        {
            "school": "南京邮电大学",
            "major": "电子科学与技术",
            "degree": "本科",
            "graduation_year": "2024"
        }
    ],
    "job_intention": {
        "expected_position": "技术型销售工程师",
        "expected_salary": "",
        "expected_city": "",
        "availability": ""
    },
    "skills": [
        "Multisim",
        "Keil",
        "Altium Designer",
        "模拟电路",
        "数字电路",
        "信号与系统",
        "硬件原理图设计",
        "EMI干扰整改",
        "传感器数据采集",
        "步进电机闭环控制",
        "示波器",
        "逻辑分析仪",
        "Excel",
        "Word",
        "PPT",
        "DeepSeek",
        "Kimi",
        "CET-6"
    ],
    "work_experience": [
        {
            "company": "武汉虹信技术服务有限责任公司（江苏分公司）",
            "position": "工程项目技术支持",
            "duration": "2026\/03 - 2026\/07",
            "description": "AI工具推广与流程提效：调研同事报账对账、开发票等重复性工作，普及DeepSeek、Kimi等AI工具，编写简易操作指南。推动AI用于发票信息提取、对账数据整理和报账材料生成，整理时间由每周2小时降至30分钟。测试与报告编制：参与供电稳定性测试与干扰排查分析，编制《供电稳定性测试报告》《干扰排查分析台账》，输出测试及分析记录，将台账整理耗时缩短了20%。"
        }
    ],
    "project_experience": [
        {
            "name": "钨酸盐卤化物荧光体的电子结构和发光研究（硬件部分）",
            "role": "硬件负责人",
            "duration": "2022\/03 - 2023\/12",
            "description": "项目介绍：针对高校科研中高频干扰环境下荧光粉拉伸测试数据不稳定的痛点，主导设计了一套基于51单片机的自动化测试装置。该装置服务于实验室核心课题组，旨在替代人工操作，实现高精度数据采集与闭环控制，支撑了OAM期刊的发表。项目职责：1.独立完成原理图设计，搭建包含51单片机最小系统、传感器调理电路及步进电机驱动的完整硬件平台。2.针对高频干扰导致的采集异常难题，通过优化PCB布局、增加磁珠滤波及接地处理，确保数据准确性。3.协同软件团队开发数字滤波算法，实现步进电机闭环控制精度达到±0.01°，并完成全链路联调测试。"
        }
    ],
    "certifications": [
        "CET-6"
    ],
    "self_evaluation": "南京邮电大学电子科学与技术专业本科，熟练运用 Multisim 仿真及 Keil 开发环境，Altium Designer 原理图与 PCB 设计；具备扎实的模电\/数电基础，良好的沟通与组织能力，擅长示波器、逻辑分析仪等硬件调试工具，具备高频干扰环境下电路 EMI 整改实战经验。曾作为硬件负责人主导「钨酸盐卤化物荧光体研究」课题，独立完成基于 51 单片机的拉伸测试装置架构设计与 EMI 优化，解决传感器数据采集异常问题，使装置运行稳定性提升 30% 以上，成果发表于 OAM 期刊。持有 CET-6 证书（542 分），可高效阅读英文技术文献。致力于在领域长期深耕，快速适应高强度技术挑战。"
}

{
    "events": [
        {
            "eventName": "ObjectCreated:PutObject",
            "eventSource": "acs:oss",
            "eventTime": "2026-10-30T08:31:06.000Z",
            "eventVersion": "1.0",
            "oss": {
                "bucket": {
                    "arn": "acs:oss:cn-hangzhou:1748673497100614:langbowei-static",
                    "name": "langbowei-static",
                    "ownerIdentity": "1748673497100614",
                    "virtualBucket": ""
                },
                "object": {
                    "deltaSize": 114324,
                    "eTag": "97B68BF1E2B78D37256C64883440AC94",
                    "key": "resumes\/1-6ae455ca-15eacd-172e9bf57ac9__widget_1704704635359_0.pdf",
                    "objectMeta": {
                        "mimeType": "application\/pdf"
                    },
                    "size": 114324
                },
                "ossSchemaVersion": "1.0",
                "ruleId": "6ace21aabfd5f4f41034504922b3ff7128aa76bb"
            },
            "region": "cn-hangzhou",
            "requestParameters": {
                "sourceIPAddress": "172.16.0.123"
            },
            "responseElements": {
                "requestId": "6AE455CAE88B9E333410F299"
            },
            "userIdentity": {
                "principalId": "300034963247836315"
            }
        }
    ]
}